M-line spectroscopic, spectroscopic ellipsometric and microscopic measurements of optical waveguides fabricated by MeV-energy N+ ion irradiation for telecom applications

István Bányász, S Berneschi, Miklós Fried, Tivadar Lohner, GN Conti, GC Righini, S Pelli, Zsolt Zolnai

THIN SOLID FILMS 0040-6090
2013

View on: MTMT: 2160247 | DOI: 10.1016/j.tsf.2012.11.134 | REAL: 8815 | WoS: 000323140600002 | Scopus: 84880851167