Influence of surface roughness on interdiffusion processes in InGaP/Ge heteroepitaxial thin films

P Joice Sophia, G Attolini, M Bosi, E Buffagni, C Ferrari, C Frigeri, Kálmán Vad, Attila Csik, Viktor Takáts, Zsolt Zolnai, D Arivuoli

ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 2162-8769
2015

View on: MTMT: 2798398 | DOI: 10.1149/2.0021503jss | REAL: 24878 | WoS: 000349549700005 | Scopus: 84923368431 | Google scholar: 2450489492899909190